SCHEDULE OF TESTING ELECTRICAL SAMPLES
SL  Specific test performed  Test method Specification against Which test are Performed  Range of testing/ Limits of operation/ Limits of detection  Measurement Uncertainty ( )  SELECT ALL 

1  Annealing test (for copper )  cl. 6.1.2 of IS 694:2010 IS 8130:1984 IS 108101: 1984 Reaff. 2011  Up to 100% 0.01 to 2500 N L.C. 0.01 N  9.55 N/mm2 at 175 N/mm2  
2  Tensile strength test for aluminum conductor  cl. 6.2.1 of IS 694:2010 IS 8130:1984 IS 108102:1984 Reaff. 2011  Up to 100% 0.01 to 2500 N L.C. 0.01 N  9.21 N/mm2 at 256 N/mm2  
3  Wrapping test for aluminum conductor  cl. 6.2.2 of IS 694:2010 IS 8130:1984 IS 108103:1984 Reaff. 2011  Qualitative  N/A  
4  Per sulphate test (for tinned copper)  cl.10.11 of IS 694:2010 IS 8130:1984 IS 108104:1984 Reaff. 2011  0.1 mg to 50 g L.C. 0.1 mg  Under process  
5  Conductor resistance tests  cl. 6.3 of IS 8130:1984 IS 108105:1984 Reaff. 2007  0.2 µΩ to 11Ω L.C. 0.02 µΩ  1.14mΩ at 12.05Ω/km  
6  Test for overall dimension, Thickness of insulation & Sheath  cl. 5.3 & 8.3 of IS 694:2010 IS 108106:1984 Reaff. 2011  0.001 mm to25 mm L.C. 0.001 mm  0.01 at 0.82mm  
7  Ageing in air oven  cl. 4.1of IS 5831:1984 IS 1081011:1984 Reaff. 2011  0.01 to 2500 N L.C. 0.01 N Up to 1000 %  0.62  
8  Shrinkage tests  IS 5831:1984 IS 1081012:1984 Reaff. 2011  1% to 100% Ambient to 300 0C L.C 01 0C  0.2 mm at 1.5 mm  
9  Static bending strength  0.2 mm at 1.5 mm  0.2 mm at 1.5 mm  0.2 mm at 1.5 mm  
10  Heat shock tests  IS 5831:1984 IS 1081014:1984 Reaff. 2011  Qualitative  N/A  
11  Hot deformation test  IS 5831:1984 IS 1081015:1984 Reaff. 2011  Up to 100% 0.001 mm to25 mm L.C. 0.001 mm  0.03mm at 0.28mm  
12  Cold bend tests  IS 5831:1984 IS 1081020:1984 Reaff. 2001  Qualitative  N/A  
13  Cold impact tests  IS 5831:1984 IS 1081021:1984 Reaff. 2011  Qualitative  N/A  
14  High voltage test (at room temperature)  cl. 10.2 of IS 694:2010 IS 1081045:1984 Reaff. 2007  0.1 KV to 10 KV 0.01 sec to 24 h.  Under Process  
15  High voltage test (water immersion AC test)  cl. 10.1 of IS 694:2010 IS 1081045:1984 Reaff. 2007  0.1 KV to 10 KV 0.01 sec to 24 h. Ambient to 100 0C  Under Process  
16  High voltage test (water immersion DC test)  cl. 10.1 of IS 694:2010 IS 1081045:1984 Reaff. 2007  0.1 KV to 10 KV 0.01 sec to 24 h. Ambient to 100 0C  Under Process  
17  Insulation resistance test ,Volume resistivity  IS 5831:1984 IS 1081043:1984 Reaff. 2011  1MΩ to 1100×106MΩ Assorted  4.5 at 63.2MΩKm 4.26% at 2.3x1013Ωcm 

18  Loss of mass in air oven  IS 5831:1984 IS 1081010:1984 Reaff. 2011  0.1 mg to 50 g L.C. 0.1 mg  0.012gm/cm2 at 0.84gm/cm2  
19  Flammability tests  Cl. 10.4 of IS 694:2010 IS 1081053:1984 Reaff. 2011  0.1 KV to 10 KV 1 mm to 600 mm L.C. 1 mm 0.01 to 24 h. L.C. 0.01 sec  .34 sec at 23 sec 15.87 mm at 269.6 mm 

20  Tensile strength and elongation at break  IS 5831:1984 IS 108107:1984 Reaff. 2011  0.01 to 2500 N L.C. 0.01 N Up to 1000 %  0.65 N/mm2 at 15.52 N/mm2 9.8% at 178 % 

21  Thermal stability test  IS 5831:1984 IS 1081060:1988 Reaff. 2005  0.1 0C to 300 0C 0.01 sec to 24 h.  3.36 minute at 96 minute  
