SCHEDULE OF TESTING ELECTRICAL SAMPLES

SL Specific test performed Test method Specification against Which test are Performed Range of testing/ Limits of operation/ Limits of detection Measurement Uncertainty ( ) SELECT ALL    
1 Annealing test (for copper ) cl. 6.1.2 of IS 694:2010 IS 8130:1984 IS 10810-1: 1984 Reaff. 2011 Up to 100% 0.01 to 2500 N L.C. 0.01 N 9.55 N/mm2 at 175 N/mm2
2 Tensile strength test for aluminum conductor cl. 6.2.1 of IS 694:2010 IS 8130:1984 IS 10810-2:1984 Reaff. 2011 Up to 100% 0.01 to 2500 N L.C. 0.01 N 9.21 N/mm2 at 256 N/mm2
3 Wrapping test for aluminum conductor cl. 6.2.2 of IS 694:2010 IS 8130:1984 IS 10810-3:1984 Reaff. 2011 Qualitative N/A
4 Per sulphate test (for tinned copper) cl.10.11 of IS 694:2010 IS 8130:1984 IS 10810-4:1984 Reaff. 2011 0.1 mg to 50 g L.C. 0.1 mg Under process
5 Conductor resistance tests cl. 6.3 of IS 8130:1984 IS 10810-5:1984 Reaff. 2007 0.2 µΩ to 11Ω L.C. 0.02 µΩ 1.14mΩ at 12.05Ω/km
6 Test for overall dimension, Thickness of insulation & Sheath cl. 5.3 & 8.3 of IS 694:2010 IS 10810-6:1984 Reaff. 2011 0.001 mm to25 mm L.C. 0.001 mm 0.01 at 0.82mm
7 Ageing in air oven cl. 4.1of IS 5831:1984 IS 10810-11:1984 Reaff. 2011 0.01 to 2500 N L.C. 0.01 N Up to 1000 % 0.62
8 Shrinkage tests IS 5831:1984 IS 10810-12:1984 Reaff. 2011 1% to 100% Ambient to 300 0C L.C 01 0C 0.2 mm at 1.5 mm
9 Static bending strength 0.2 mm at 1.5 mm 0.2 mm at 1.5 mm 0.2 mm at 1.5 mm
10 Heat shock tests IS 5831:1984 IS 10810-14:1984 Reaff. 2011 Qualitative N/A
11 Hot deformation test IS 5831:1984 IS 10810-15:1984 Reaff. 2011 Up to 100% 0.001 mm to25 mm L.C. 0.001 mm 0.03mm at 0.28mm
12 Cold bend tests IS 5831:1984 IS 10810-20:1984 Reaff. 2001 Qualitative N/A
13 Cold impact tests IS 5831:1984 IS 10810-21:1984 Reaff. 2011 Qualitative N/A
14 High voltage test (at room temperature) cl. 10.2 of IS 694:2010 IS 10810-45:1984 Reaff. 2007 0.1 KV to 10 KV 0.01 sec to 24 h. Under Process
15 High voltage test (water immersion AC test) cl. 10.1 of IS 694:2010 IS 10810-45:1984 Reaff. 2007 0.1 KV to 10 KV 0.01 sec to 24 h. Ambient to 100 0C Under Process
16 High voltage test (water immersion DC test) cl. 10.1 of IS 694:2010 IS 10810-45:1984 Reaff. 2007 0.1 KV to 10 KV 0.01 sec to 24 h. Ambient to 100 0C Under Process
17 Insulation resistance test ,Volume resistivity IS 5831:1984 IS 10810-43:1984 Reaff. 2011 1MΩ to 1-100×106MΩ Assorted 4.5 at 63.2MΩKm
4.26% at 2.3x1013Ωcm

18 Loss of mass in air oven IS 5831:1984 IS 10810-10:1984 Reaff. 2011 0.1 mg to 50 g L.C. 0.1 mg 0.012gm/cm2 at 0.84gm/cm2
19 Flammability tests Cl. 10.4 of IS 694:2010 IS 10810-53:1984 Reaff. 2011 0.1 KV to 10 KV 1 mm to 600 mm L.C. 1 mm 0.01 to 24 h. L.C. 0.01 sec .34 sec at 23 sec
15.87 mm at 269.6 mm

20 Tensile strength and elongation at break IS 5831:1984 IS 10810-7:1984 Reaff. 2011 0.01 to 2500 N L.C. 0.01 N Up to 1000 % 0.65 N/mm2 at 15.52 N/mm2
9.8% at 178 %

21 Thermal stability test IS 5831:1984 IS 10810-60:1988 Reaff. 2005 0.1 0C to 300 0C 0.01 sec to 24 h. 3.36 minute at 96 minute